A Fast Nonlinear Timing Analysis Method for Nanometer Technologies

摘要：

Timing analysis Method needs to be both accurate and efficient, especially for the submicron VLSI circuit designs. In this paper, a fast high-accuracy timing analysis method is presented. Nonlinear Current-based cell delay model is utilized, which can achieve the goal of accurate nanometer timing including voltage and temperature variation. At the same time, we choose a quick reduced-order network model to keep this method efficient. Experimental results in a 90nm technology show that the delays are accurately estimated, while the running time and memory cost is at a low level.

作者: Ruijing Shen Xiangqing He

作者单位: Institute of Microelectronics CAD, Tsinghua University, Beijing, P.R.China

会议类型: 国际会议

会议名称: 2007年通信、电路与系统国际会议(2007 International Conference on Communications,Circuits and Systems Proceedings)

会议地点: 日本福冈

会议语种:英文

在线出版日期: 2007-07-11（万方平台首次上网日期，不代表论文的发表时间）