Analytical Model for the Surface Electrical field Distributions of Double RESURF Devices with Gaussian-doped P-top Region
In this paper, an analytical model for the surface electrical field distributions of double RESURF devices with Gaussian-doped P-top region is presented. Based on the 2-D Poissons solution, the model gives the closed form solutions of the surface potential and electrical field distributions as a function of the structure parameters and drain bias; the dependence of breakdown voltage on drift region length and thickness is calculated. An effectual way to gain the optimum high-voltage devices is also proposed. All analytical results are well verified by simulation results obtained by MEDICI and previous experimental data, showing the validity of the model presented here.
Qi Li Zhaoji Li Bo Zhang
IC Design Center, University of Electronic Science & Technology, Chengdu Sichuan Province, China
国际会议
2007年通信、电路与系统国际会议(2007 International Conference on Communications,Circuits and Systems Proceedings)
日本福冈
英文
2007-07-11(万方平台首次上网日期,不代表论文的发表时间)