SiGe:H THIN FILMS PREPARED BY PLASMA ASSISTED REACTIVE THERMAL CHEMICAL VAPOR DEPOSITION
In this work, very high frequency plasma assisted reactive thermal chemical vapor deposition (VHFPA-RTCVD) technology is applied to prepare SiGe:H thin films on a low-temperature substrate. The structural properties of SiGe:H thin films are investigated with varying H2 dilution for different germanium concentrations (GCs). The absorption coefficient, photo-conductivity and dark-conductivity of SiGe:H thin films in different phases are also measured. We observed that under the same hydrogen dilution the growth rates of SiGe:H thin films almost keep unchanged with the increase of GC. And we also observed that transition from microcrystalline to amorphous growth happens easier in the lower GC while comparing with the higher GC of SiGe:H alloys. Moreover, we found that with the increase of germanium incorporation into alloys, the photoconductivity decrease firstly and consequently ascend, and dark conductivity keeps an ascending trend.
Liping Zhang Jianjun Zhang Zeren Shang Zengxin Hu Jian Sun Yin Zhao Xinhua Geng
国际会议
2007世界太阳能大会(Proceedings of ISES Solar World Congress 2007)
北京
英文
2007-09-18(万方平台首次上网日期,不代表论文的发表时间)