Cross-sectional electron microscopy of the interface structures in a galvannealed dual-phase steel

摘要：

The zinc layer coated on the dual phase steel via a galvannealing treatment can provide excellent anti-corrosion properties. Since the coating layer is very thin, it is very difficult to acquire a thin foil for transmission electron microscopy by the traditional twin jet method. The focus ion beam (FIB) method was used in the present study to obtain high quality specimens for investigating the details of the microstructure in the coated layer. It was found that a fully microalloying layer exists between the zinc layer and iron matrix. The zinc rich phases ζ and δ can be observed in the coated layer. However, the Γ phase could not be detected in the present study, although it should form with a low zinc content in the coated layer.

关键词： Focus ion beam method Galvannealed steel Microalloying and Dual phase steel

作者: F.H.Kao C.Y.Chen W.C.Li C.Y.Huang J.R.Yang

作者单位: Department of Materials Science and Engineering, National Taiwan University, Taiwan Steel and Aluminum Research and Development Department, China Steel Co.Kaohsiung, Taiwan

会议类型: 国际会议

会议名称: The Fifth International Conference on Physical and Numerical Simulation of Materials Processing(第五届材料与热加工物理模拟及数值模拟国际会议)

会议地点: 郑州

会议语种:英文

在线出版日期: 2007-10-23（万方平台首次上网日期，不代表论文的发表时间）