Nanoscopic Characterization of Textured Substrate For Thin Film Solar Cells

摘要：

This paper presents a nanoscopic characterization of a series of textured substrate for poly-Si thin film solar cells application performed by Atomic Force Microscopy (AFM), in order to find the optimum texture substrate and realize the light trapping. The relationship between average slopes (Tan q) and photovoltaics performance are studied based on the experimental results. The textured ZnO/Ag/SnO2/glass with Tan q of 0.08 yields the maximum conversion efficiency for Jsc and Voc. Although the poly-Si deposited on highly textured substrate (s>37 nm) shows excellence the light trapping properties, it tend to deteriorate the poly-Si (220) preferential growth and exhibits n-type character, yielding poor photovoltaic performances. In addition, changing optical reflectance and microstructure due to textured substrates are also discussed.

作者: R.Muhida AGE Sutjipto T.Toyama H.Okamoto

作者单位: Department of Mechatronics Engineering Department of Manufacturing and Materials Engineering Faculty of Engineering, International Islamic Department of System Innovation, Graduate School of Engineering Science,Osaka University, Toyonaka,

会议类型: 国际会议

会议名称: The Fifth International Conference on Physical and Numerical Simulation of Materials Processing(第五届材料与热加工物理模拟及数值模拟国际会议)

会议地点: 郑州

会议语种:英文

在线出版日期: 2007-10-23（万方平台首次上网日期，不代表论文的发表时间）