A Test Scheduling Algorithm Based on Two-Stage GA

摘要：

In this paper, we present a new algorithm to co-optimize the core wrapper design and the SOC test scheduling. The SOC test scheduling problem is first formulated into a twodimension floorplan problem and a sequence pair architecture is used to represent it. Then we propose a two-stage GA (Genetic Algorithm) to solve the SOC test scheduling problem.Experiments on ITC02 benchmark show that our algorithm can effectively reduce test time so as to decrease SOC test cost.

作者: Y Yu X Y Peng Y Peng

作者单位: Institute of Automatic Test and Control, Harbin Institute of Technology, Harbin 150001, China

会议类型: 国际会议

会议名称: 第四届仪器科学与技术国际会议( 4th International Symposium on Instrumentation and Science and Tcchnology)

会议地点: 哈尔滨

会议语种:英文

页码: 658-662

在线出版日期: 2006-08-08（万方平台首次上网日期，不代表论文的发表时间）