The R&D Efficiency of the Chinese Manufacturing Industry: Stochastic Frontier vs. Data Envelopment Analysis

摘要：

Technological innovation is an increasingly important determinant of the Chinese manufacturing industry; while improving R&D efficiency plays a significant role in the field of technological innovation. In this paper, the SFA (Stochastic Frontier Analysis) as well as the CRS (Constant Return to Scale) and VRS (Variable Return to Scale) methods of the DEA (Data Envelopment Analysis) models are used to evaluate the relative efficiency of a sample from the manufacturing industry in China. Given the theoretical differences between the two techniques, this paper gives an empirical comparison of the two models using the calculation of efficiency scores. The frequency distributions of the measurements as well as Spearman correlation coefficients are presented to examine the agreement of these two approaches. Some discussions to R&D efficiency results are addressed in the conclusion.

关键词： DEA SFA Statistical Test R&D Efficiency

作者: LI Shuangjie LIU Yanan

作者单位: School of Economics and Management Beijing University of Technology Beijing, P.R. China

会议类型: 国际会议

会议名称: The Fifth InternationalSymposium on Management of Technology(ISMOT07)(第五届技术与创新管理国际研讨会)

会议地点: 杭州

会议语种:英文

页码: 843-846

在线出版日期: 2007-06-01（万方平台首次上网日期，不代表论文的发表时间）