Polycrystalline Silicon Thin-film Transistor with Metal-replaced Junctions
Polycrystalline silicon thin-film transistor (TFT) with metal-replaced junctions (MERJs) is demonstrated. The TFT is found to exhibit not only reduced parasitic resistance but also improved intrinsic device characteristics. A three-mask MERJ TFT with metallic gate is also demonstrated. The reduced delay on the low-resistance metallic gate line makes the 3mask MERJ TFT technology particularly suitable for realizing large-area active-matrix panels.
Metal-replaced Junction Polycrystalline Silicon Thin-film Transistor
Man Wong Dongli Zhang Thomas Chow
Dept. of Electronic and Computer Engineering, Hong Kong University of Science and Technology, Clear Water Bay,Kowloon, Hong Kong, China
国际会议
上海
英文
507-512
2007-03-12(万方平台首次上网日期,不代表论文的发表时间)