Impurities Role in MgO Degradation and Basic Gettering Features in PDP
The key role of MgO is well recognized in PDPs technology. In fact, the ability to release a large number of secondary electrons, the low sputtering rate and the high electrical resistance make this material suitable for ensuring good performances of the Plasma Display Panels. However, it is known that during the PDPs manufacturing process, MgO layer should withstand severe thermal cycles in harsh environmental conditions. During such processes, a significant contamination of the oxide, mainly due to moisture and carbon dioxide, occurs: the detrimental action of these gas species on the MgO characteristics has been widely reported in the literature and it will be reviewed in this paper.In particular, both Magnesium hydroxide and carbonate are easily sputtered, decreasing panels life; increase discharge voltage, affecting power consumption; loose transparency, thus promoting a degradation of the overall efficiency of the displays.A possible approach trying to reduce the MgO contamination is based on the availability of some materials providing a gettering action able to compete against the impurities sorption speed of the oxide layer. An assessment of a suitable getter configuration is proposed in this paper, starting from the basic distinction between gettering action during the process and gettering action during the life. Finally, a modeling of the effect of this getter configuration in reducing MgO contamination is proposed.
MgO Contaminants Gettering
Corrado Carretti Antonio Bonucci Stefano Tominetti
SAES Getters S. p. A., Viale Italia 77, 20020 La in ate (MI) Italy
国际会议
上海
英文
758-763
2007-03-12（万方平台首次上网日期，不代表论文的发表时间）