A Current-scan Driving Method to Improve the Image Quality of Active-matrix FED

摘要：

We present a new driving method of current scanning for active-matrix field emission display ( AMFED) to improve image quality. The current-scan driving is to use current sources for scan signals instead of conventional voltage pulses, and the current sources are addressed to the source electrode of a-Si TFT used as a switching device of AMFED. The developed current-scan driving showed a better image quality than conventional voltage driving for the AMFED with carbon nano-tube emitters.

关键词： FED Active-matrix Driving Current-scan CNT Nano-emitter TFT

作者: Dae-Jun Kim Jin-Woo Jeong Jeong-Seob Oh Yoon-Ho Song

作者单位: IT Convergence & Components Laboratory,Electronics and Telecommunications Research Institute(ETRI),161 Gajeong-Dong, Yuseong-Gu, Daejeon, 305-350, Korea

会议类型: 国际会议

会议名称: 2007亚洲显示国际会议（AD07）

会议地点: 上海

会议语种:英文

页码: 1296-1299

在线出版日期: 2007-03-12（万方平台首次上网日期，不代表论文的发表时间）