Field Emission Properties of Tungsten Carbide Thin Films Formed on Tungsten Tips
Field emission patterns of tungsten carbide film formed on a tungsten tip surface were observed after the tungsten tip was annealed at appropriate experimental conditions. Current voltage characteristic of the tungsten carbide film was measured in situ, and its work function was self-consistently calculated to be 3.73 eV according to the Fowler-Nordheim theory. Compared with clean tungsten tips, the work function of the tungsten tip coated with tungsten carbide film is lowered and the emission current stability is improved, which indicates the usefulness of tungsten carbide in the development of field emitters.
Tungsten Carbide Thin Films Field Emission Work Function
Jianping Sun
Institute of Modern Electronic Technology, School of Electric & Electronic Engineering, North China Electric Power University,Beijing 102206, China
国际会议
上海
英文
1328-1332
2007-03-12（万方平台首次上网日期，不代表论文的发表时间）