Validation of cie averaged led intensity measurement by comparing results of the photometric and spectroradiometric methods with different traceabilities

摘要：

We compare two different methods for measuring the averaged LED intensity defined by CIE. One is the photometric method using a photometer, whose luminous responsivity is traceable to the detector-based candela scale of KRISS. The other is the spectroradiometric method using a spectroradiometer, which is calibrated with a spectral irradiance standard lamp supplied by NIST. From the agreement of the results between these two methods with different traceabilities, we validate our measurement capability for the CIE averaged LED intensity.

关键词： light-emitting diode averaged LED intensity photometer spectroradiometer

作者: Yong-Wan Kim Seongchong Park Dong-Hoon Lee Seung-Nam Park

作者单位: Division of Physical Metrology, Korea Research Institute of Standards and Science (KRISS), 1 Doryong-Dong, Yuseong-Gu, Daejeon, Rep. Korea

会议类型: 国际会议

会议名称: 26th Session of the CIE(国际照明委员会（CIE）第26届大会)

会议地点: 北京

会议语种:英文

页码: 347-349

在线出版日期: 2007-07-04（万方平台首次上网日期，不代表论文的发表时间）