Analysis of field emission operation- induced defects in carbon nanotube via a combination of field emission measurement and Raman spectroscopy

作者: Yeoniu Lee Sora Lee Duk Young Jeon

作者单位: Department of Materials Science & Engineering, Korea Advanced Institute of Science and Technology 37 Samsung SDI Co., LTD. 428-5, Gongse-ri, Giheung-eup, Yongin-si, Gyeinggi-do, Republic of Korea

会议类型: 国际会议

会议名称: 19Th International Vacuum Nanoelectronics Conference & 50th International Field Emission Symposium(第19届真空微纳国际年会暨第50届场致发射国际会议)

会议地点: 桂林

会议语种:英文

页码: 79-80

在线出版日期: 2006-07-17（万方平台首次上网日期，不代表论文的发表时间）