会议专题

Study on the internal damage of semiconductor devices and external damage of insulator layers

Wenguo Hu Yiping Lin Zhuguan Liang Ling Xiao Yawen Li Ping Li Jian Wang Kailin Zhou E.I.Rau

Department of Physics, Yunnan University, Kunming, 650091, china Department of Electrical Engineering, Yunnan University, Kunming, 650091, china Kunming Institute of Physics, Kunming, 650223, China MSU, Moscow, Russia

国际会议

19Th International Vacuum Nanoelectronics Conference & 50th International Field Emission Symposium(第19届真空微纳国际年会暨第50届场致发射国际会议)

桂林

英文

489-490

2006-07-17(万方平台首次上网日期,不代表论文的发表时间)