Study on the internal damage of semiconductor devices and external damage of insulator layers
Wenguo Hu Yiping Lin Zhuguan Liang Ling Xiao Yawen Li Ping Li Jian Wang Kailin Zhou E.I.Rau
Department of Physics, Yunnan University, Kunming, 650091, china Department of Electrical Engineering, Yunnan University, Kunming, 650091, china Kunming Institute of Physics, Kunming, 650223, China MSU, Moscow, Russia
国际会议
桂林
英文
489-490
2006-07-17(万方平台首次上网日期,不代表论文的发表时间)