Study of Differential Evolution on ATPG

摘要：

As a new heuristic approach, differential evolution has shown superior performance in continous space capable of handling nondifferentiable, nonlinear and multimodal objective functions. This paper reports a study of DE to operate on discrete binary variables, which are test patterns of sequential circuits. Preliminary experimental results of automatic test pattern generation (ATPG) for sequential circuits based on DE are provided and comparisons are discussed.

作者: XU ChuanPei LI Zhi MO Wei

作者单位: Dept. of Electronic Engineering Guilin University of Electronic Technology Guilin, Guangxi, China

会议类型: 国际会议

会议名称: 2006 International Conference on Communications,Circuits and Systems(第四届国际通信、电路与系统学术会议)

会议地点: 广西桂林

会议语种:英文

页码: 2084-2087

在线出版日期: 2006-06-25（万方平台首次上网日期，不代表论文的发表时间）