A Novel Dynamic Current Analysis for ADC Testing

摘要：

The increasing importance of mixed-signal circuits has brought about a new important issue in testing this kind of circuits. Nevertheless, these techniques are difficult and costly. In an attempt to promote mixed-signal circuits testing, a novel fault detection method is presented in this paper. This method uses wavelet transform based dynamic current (Idd) analysis to detect the faults. The experimental results for an ADC circuit show that the proposed method not only can effectively detect faults, but also have higher sensitivity than integral and FFT method. Furthermore, the impact of different mother wavelet on the sensitivity of fault detection is addressed.

作者: Zhu Yan-qing He Yi-gang Yang Hui

作者单位: College of Electrical and Information Engineering Hunan University Changsha, Hunan, China China Electronic Product Reliability and Environmental Testing Research Institute Guangzhou, Guangdo

会议类型: 国际会议

会议名称: 2006 International Conference on Communications,Circuits and Systems(第四届国际通信、电路与系统学术会议)

会议地点: 广西桂林

会议语种:英文

页码: 2167-2171

在线出版日期: 2006-06-25（万方平台首次上网日期，不代表论文的发表时间）