A Note on Chance-Constrained Optimization of Analog Integrated Circuit

摘要：

As the design-manufacturing interface becomes increasingly complicated with IC technology scaling, the corresponding process variability poses great challenges for nanoscale analog design. In this paper we propose to formulate the analog IC design with variability problem as a specific type of chance-constrained optimization problem, namely chance-constrained posynomial programming, in which statistical variations in both the process parameters and design variables can be explicitly incorporated. Using such constrained optimization approach, automated statistical design can be obtained with very suboptimal design cost, and parametric yield of each specification can be guaranteed. Finally, the method is illustrated by considering the example of a ring oscillator.

作者: Kan-Lin Hsiung

作者单位: Department of Electrical Engineering, Stanford University Stanford, CA 94305-9510

会议类型: 国际会议

会议名称: 2006 International Conference on Communications,Circuits and Systems(第四届国际通信、电路与系统学术会议)

会议地点: 广西桂林

会议语种:英文

页码: 2324-2326

在线出版日期: 2006-06-25（万方平台首次上网日期，不代表论文的发表时间）