The Design of the Microwave T/R Module Automation Test System Based on the Embedded System
This paper describes the design principles of the automated test system for microwave T/R module, with the embedded system achieving the function control of the whole system. The system could implement automatic measurement of all the time domain and frequency domain parameters in the sixteen 32-channel modules using the single-connection multiple-measurement (SCMM) technique, and conduct automatic S-parameter test and error correction under both continuous wave and pulse according to presetted test programs. With the application of the embedded system, the system ranks a high flexibility, high reliability, open infrastructure and good scalability, and the performance specification has made it among the advanced products worldwide.
Yang Wen Qin kai-yu He Pi-yan
School of Automation Engineering University of Electronic Science Technology of China Chengdu, Sichuan, China
国际会议
2006 International Conference on Communications,Circuits and Systems(第四届国际通信、电路与系统学术会议)
广西桂林
英文
2817-2821
2006-06-25（万方平台首次上网日期，不代表论文的发表时间）