会议专题

MANY-PARTICLE SIMULATION FOR ION LOSS DURING ION EXCITATION AND DETECTION IN A FOURIER TRANSFORM ION CYCLOTRON RESONANCE MASS SPECTROMETER

国际会议

The 11th International Beijing Conference and Exhibition on Instrumental Analysis(第十一届北京分析测试学术报告会)(BCEIA 2005)

北京

英文

2005-10-20(万方平台首次上网日期,不代表论文的发表时间)