会议专题

Study terahertz ellipsometry setups for measuring metals and dielectrics using free electron laser light source

国际会议

2006 Joint 31st International Conference on Infrared and Millimeter Waves and 14th International Conference on Terahertz Electronics

上海

英文

553

2006-09-18(万方平台首次上网日期,不代表论文的发表时间)