DNA damage levels in electronics workers in Southern China:A micro-whole blood comet assay
A cross-sectional study was conducted on a total of 584 exposed subjects and 138 controls in an electronics factory.We evaluated DNA damage levels of different workers exposed to hazard inside electronics factories in South China where the electronics industry is especially prevalent in order to find out the most dangerous risk factor.The exposed hazards including isopropanol(IPO),lead,noise,video display terminals(VDT),lead in high-temperature(high-temp)environment,and IPO in high-temp environment.DNA damage detection was performed by the micro-whole blood comet assay using peripheral blood.DNA damage levels were estimated by percent tail DNA(%T).Linear regression models were used to test DNA damage differences between exposed groups and control group with adjustment to potential confounding factors.The level of DNA damage was more significant in both lead in high-temp and IPO in high-temp environment groups than that of controls(p<0.05).The differences remain significant after stratified by smoking status(p<0.05).There were no significant differences between groups exposed to IPO,lead,noise,VDT environment and controls.In conclusion,potential risk factors of DNA damages to electronics workers were identified.Special attention should be paid to workers exposed to IPO and lead in high-temperature environments.
occupational exposure electronics DNA damage micro-whole blood comet assay
Zhiqiang Zhao Xiumei Xinga Xiaoyan Ou Xinxia Liu Ridong Zhou Huimin Zhang Linqing Yang Zhixiong Zhuang Xiaolin Su Yao Lu Jun Jiang Yarui Yang Dong Cui Yun He
Guangzhou Key Laboratory of Environmental Pollution and Risk Assessment,School of Public Health,Sun Prevention and Control Center for Occupational Diseases,Zhongshan Center for Disease Control and Pre Shenzhen Center for Disease Control and Prevention,Shenzhen,China
国内会议
北京
英文
1-9
2019-11-01（万方平台首次上网日期，不代表论文的发表时间）