A new algorithm for high-frequency capacitance performance parameter testing based on multiple ways of errors eliminate

摘要：

　　High-frequency capacitors of high-quality are widely used in military and high-end consumer electronic products, it”s particularly important to measure Q value and other performance parameters of high-frequency capacitance.The fixture effects error of measurement system is particularly acute under the infl uence of capacitance for high frequency band.Aiming at this issue,a way to eliminate errors of the testing system based on modeling of telomeric extension and auto telomeric extension technology combines with de embeding technologies is proposed to eliminate errors produced by fixture influence, and then using polynomial fitting algorithm that based on least square method to compute performance parameters and equivalent circuit parameters accurately.Experimental results indicate that the test data of proposed algorithm are more accurate compared with that of using the de embeding technique simply for measuring capacitance at 10GHz or higher frequencies.

关键词： high-frequency capacitors capacitance parameter vector network analysers de-embeding polynomial fitting

作者: Ming Hong Detian Huang Peiting Gu Minghang Wang Peizhong Liu

作者单位: College of Engineering,Huaqiao University,Fujian,China

会议类型: 国内会议

会议名称: 2015年中国人工智能学会神经网络与计算智能专委会年会暨第十三届泉州市科学技术协会年会

会议地点: 福建泉州

会议语种:英文

页码: 221-225

在线出版日期: 2015-11-06（万方平台首次上网日期，不代表论文的发表时间）