Advanced metrology on ingot-level:state-of-the-art and value

摘要：

Why do we care about the as-grown quality of silicon?Absorber material can limit and cause variance in solar cell performance,durability and degradation Can we monitor and control these on industrial level?What does ”quality” of the silicon absorber actually mean?What are the parameters?

作者: Bernhard Mitchell Daniel Chung Jürgen W.Weber Thorsten Trupke

作者单位: University of New South Wales,Sydney,Australia BT Imaging Pty Ltd,Sydney,Australia University of New South Wales,Sydney,Australia;BT Imaging Pty Ltd,Sydney,Australia

会议类型: 国内会议

会议名称: 第十二届中国太阳级硅及光伏发电研讨会

会议地点: 浙江嘉兴

会议语种:英文

页码: 1-19

在线出版日期: 2016-11-24（万方平台首次上网日期，不代表论文的发表时间）