会议专题

Evolution of ”411”<148> texture in thin-gauge grain-oriented silicon steels

  The significant distribution of ”411 ” < 148 > texture exists during the preparation of thin-gauge grain-oriented silicon steels, which has effect on the abnormal growth of Goss grains during the secondary recrystallization.The change of micro-structure in the manufacture of thin-gauge grain-oriented silicon steel was investigated by XRD and EBSD technique.The results shows that, ” 411 ” < 148 > texture mainly exists in the center layer of hot rolled plates.As the cold rolling reduction increase, ”411 ”<148 > orientation rotated to α fiber texture and its proportion gradually reduced.Finally, ”411”< 148 > orientation retained near the boundaries of deformed α fiber grain in at 90% cold rolling reduction.Moreover, a few ” 411 ” < 148 > orientation can also be found in the inner of deformed ” 112 ” < 110> grain.After annealing treatment, a small number of γ fiber texture preferred nucleating and recrystallizing between the deformed bands.The ” 411 ” < 148 > recrystallization texture occurs in the late stage of recrystallization, mainly nucleating in boundary of the deformed α fiber orientation and quite a few ”411 ”<148 > orientation nucleates in the inner of ”111 ” < 112 > grains, which cannot be observed in the ”100” <011 >.The ”411” < 148 > recrystallization texture formed after annealing mainly depends on the strong α texture and weak γ texture that formed in high cold rolling, in other words, ” 411 ” < 148 > orientation genetic of hot rolled plates was not strong.

Thin-gauge grain-oriented silicon steel ”411” <148> texture α-fiber deformation recrystallization

HE Chengxu YANG Fuyao YAN Guochun MENG Li Ma Guang CHEN Xin

School of Materials Science and Engineering;University of Science and Technology Beijing, Beijing 10 School of Materials Science and Engineering;University of Science and Technology Beijing, Beijing 10 School of Materials Science and Engineering;University of Science and Technology Beijing, Beijing 10 Department of Electrical Engineering New Materials and Microelectronics, State Grid Smart Grid Resea

国内会议

第十四届中国体视学与图像分析学术会议

贵阳

英文

191-199

2015-09-01(万方平台首次上网日期,不代表论文的发表时间)