Simplified,High-Throughput TOF-SIMS Analysis via HR2 and Uniform Molecular Imaging of Rough Surfaces

摘要：

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is becomingindispensable as a discovery tool in biological and complex materials research owingto the unique capacity for 2D and 3D imaging of molecular and elemental species atsub-micron spatial resolution,at high abundance sensitivity,and without the sampletreatments required by e.g.MALDI or fluorescence microscopy.The technologiesrequired for increased productivity and uniform imaging of rough surfaces are thefocus of this discussion.Specifically,we will discuss the advanced HR2molecularimaging that is now the default mode of 2D molecular imaging because both highmass resolution and high lateral resolution are achieved simultaneously.

作者: Gregory L.Fisher

作者单位: Physical Electronics,Chanhassen,MN,United States

会议类型: 国内会议

会议名称: 第五届中国二次离子质谱学会议

会议地点: 北京

会议语种:英文

页码: 102-103

在线出版日期: 2014-10-18（万方平台首次上网日期，不代表论文的发表时间）