Accelerated Burn-in for n-Subpopulations with Stochastic Degradation

摘要：

　　Often within any population of components there are strong and weak subpopulations,most notably in advanced electronic products.Burn-in test is often used to eliminate the early failures and reduce the warranty cost for those devices.This paper considers an accelerated burn-in process for a degradation-based heterogeneous population.An optimization model is formulated to achieve the optimal burn-in time and burn-in threshold.Numerical examples are provided to demonstrate the effectiveness of the accelerated burn-in process.

关键词： Accelerated burn-in heterogeneous population Mixture degradation

作者: Yisha Xiang

作者单位: Department of Management Science,School of Business Sun Yat-Sen University Guangzhou,517025,China

会议类型: 国内会议

会议名称: 中国运筹学会可靠性分会第九届可靠性学术会议

会议地点: 长沙

会议语种:英文

页码: 31-41

在线出版日期: 2013-04-20（万方平台首次上网日期，不代表论文的发表时间）