Characterisation of YSZ layers deposited on Y2O3 buffered textured tapes for coated conductors
Yttria-stabilized zirconia (YSZ) films were deposited on Y2O3/Ni-5at.%W substrates serving as the barrier layers for coated conductors by reel-to-reel direct-current (D.C.) magnetron reactive sputtering.The deposition parameters, such as the substrate temperature and tape moving speed, were systematically investigated.X-ray diffraction analysis confirmed that optimized YSZ/Y2O3 buffer layers showed excellent in-plane and out-of-plane textures.Atomic force microscope revealed a smooth, dense and crack-free surface.The subsequent CeO2 cap layer and 1 μrn-thick YBa2Cu3O7-δ film sequentially prepared, showing the critical current density Jc under 77 K, self-field of 1.4MA/cm2.
YSZ barrier layer YBa2Cu3O7-δ reactive sputtering texture
Yudong Xia Jie Xiong Fei Zhang Yan Xue Kai Hu Xiaohui Zhao Bowan Tao
State Key Laboratory of Electronic Thin Film and Integrated Devices,University of Electronic Science and Technology of China,Chengdu,610054 People”s Republic of China
国内会议
成都
英文
337-342
2013-11-15（万方平台首次上网日期，不代表论文的发表时间）