An accurate multislice method for low energy transmission electron diffraction

摘要：

An accurate multislice method considering the spherical surface correction is carried out for low energy transmission electron diffraction (LETED) ( 100 ≤ kV). Results calculated by the sphere corrected multislice (SCMS) method and the conventional multislice (CMS) method (taking the parabolic approximation) with different accelerating voltages, different Debye-Waller factors and tilt beams are quantificationally compared with each other. It is shown that only the SCMS method is suitable to calculate the LETED and imaging since the errors of the CMS is significant in the case of LETED.

关键词： Image simulation LEED real space method multislice method

作者: Can Ying Cai Jiang Hua Chen

作者单位: Center for High-Resolution Electron Microscopy, College of Materials Science & Engineering, Hunan Un Center for High-Resolution Electron Microscopy, College of Materials Science & Engineering, Hunan Un

会议类型: 国内会议

会议名称: 2010中国材料研讨会

会议地点: 长沙

会议语种:英文

页码: 1-20

在线出版日期: 2010-06-19（万方平台首次上网日期，不代表论文的发表时间）