An accurate multislice method for low energy transmission electron diffraction
An accurate multislice method considering the spherical surface correction is carried out for low energy transmission electron diffraction (LETED) ( 100 ≤ kV). Results calculated by the sphere corrected multislice (SCMS) method and the conventional multislice (CMS) method (taking the parabolic approximation) with different accelerating voltages, different Debye-Waller factors and tilt beams are quantificationally compared with each other. It is shown that only the SCMS method is suitable to calculate the LETED and imaging since the errors of the CMS is significant in the case of LETED.
Image simulation LEED real space method multislice method
Can Ying Cai Jiang Hua Chen
Center for High-Resolution Electron Microscopy, College of Materials Science & Engineering, Hunan Un Center for High-Resolution Electron Microscopy, College of Materials Science & Engineering, Hunan Un
国内会议
长沙
英文
1-20
2010-06-19(万方平台首次上网日期,不代表论文的发表时间)