Revolutionary AOI Technology to drastically reduce AOI operation cost

摘要：

Today, more than ever, an AOI process requires both inspection and verification process to produce effective, cost saving results to drive maximum yield. Verification In Parallel Technology (VIP in short) is an innovative new approach for AOI that enables PCB manufacturers to dramatically reduce operational costs, without compromising on quality detection and throughput.

关键词： 并行处理 光学检测 质量检测

作者: Mr Benny Solomon

作者单位: Orbotech Pacific Ltd

会议类型: 国内会议

会议名称: 2004春季国际PCB技术/信息论坛

会议地点: 上海

会议语种:英文

页码: 390-398

在线出版日期: 2004-03-08（万方平台首次上网日期，不代表论文的发表时间）