会议专题

Introduction to Image Sensor Device Testing

In this article, we would introduce preliminary knowledge and principle of ISD as well as some basic technical and market trend.Based on understanding the basis of ISD, we would go one step deeper into how to test ISD by introducing the common method of testing used by ATE industry. In addition, we would provide test examples to let readers understand some details of testing ISD by analyzing a real test case.

自动测试设备 图像传感器 器件测试

李鉴睿 吴坚

Applications Development Center, Semiconductor Testing Division, Teradyne(Shanghai) Co., Ltd.,China Shanghai 201206

国内会议

第五届中国测试学术会议

苏州

英文

410-415

2008-05-21(万方平台首次上网日期,不代表论文的发表时间)