Detecting Opens in Fan-out Mode for Flash Testing

摘要：

To lower cost of flash testing, fan-out mode, also called wired-OR mode is implemented to increase testing parallelism. During applying this mode, some issues must be solved and opens are one of them. This article discusses opens impact of different type of pins and gives a simple method to catch higher address pin opens which may be bypassed incautiously.

关键词： Flash测试 扇出模式 并行测试 引脚类型

作者: Zhang,Jian

作者单位: Verigy Co., Ltd Shanghai

会议类型: 国内会议

会议名称: 第五届中国测试学术会议

会议地点: 苏州

会议语种:英文

页码: 398-400

在线出版日期: 2008-05-21（万方平台首次上网日期，不代表论文的发表时间）