会议专题

TDR DIB design rules for testability and reliability

In ATE world, testability, reliability and profitability are three very important things. To achieve these, several keys must be highly respected. This paper talks about one of those keys-TDR. which is a tool for us to compensate the propagation time for signals to travel from PE within a tester to all DUT on the DIB. This paper first demonstrates the propagation of a signal in time domain, then simulates the reflections at an impedance mismatching point, followed by TDR principles and methodology, and finally gives some advices on DIB designs in favor of TDR.

时间域反射计 特性阻抗 阻抗匹配 可测性设计

TROY Zhang

Teradyne(Shanghai) Co., Ltd.,China Shanghai 201206

国内会议

第五届中国测试学术会议

苏州

英文

226-229

2008-05-21(万方平台首次上网日期,不代表论文的发表时间)