会议专题

Interesting Applications of Digital Source and Digital Capture

Functional testing of today”s highly complex devices offers many challenges. Digital device tests include both traditional deterministic pattern tests and digital tests that produce variable data output. Register-based setup and digital waveform capture is common in many devices.The Digital Source and Capture features offer powerful solutions to these test challenges. Creative application of Digital Source and Capture can save test time, reduce test setup maintenance and improve reusability of test program content.A Digital Source technique for efficient register-based device setup is described. It offers great flexibility during program development, fast and efficient multi-site support for variable trim data and zero execution time overhead in most applications.A Digital Capture technique for fast data re-alignment to a frame-sync signal without using match-loops is described.

数字视频 视频编辑 视频采集

Yin Kun Kent Luehman

Verigy

国内会议

第五届中国测试学术会议

苏州

英文

88-92

2008-05-21(万方平台首次上网日期,不代表论文的发表时间)