Managing ATE Maintenance to Reduce Device Testing Cost
A production loss based maintenance plan is proposed to reduce the semiconductor testing cost due to unscheduled ATE (Automatic Test Equipment) downtime. Three maintenance methods, active redundancy, standby redundancy and vendor repair, are proposed and their impacts on the repair time, i.e. the downtime period, are compared under various repair scenarios.By reducing the ATE downtime, the system utilization increases and hence the production loss is mitigated, if not minimized.This method is different from existing approaches such as multiple sites testing or low cost ATE testing. Leveraging the aggregate cost model, decision makers can determine the maintenance method that minimizes the production loss. A numerical example is used to demonstrate the application of the new method. Results show that using redundant modules is a very effective approach to reduce the semiconductor production loss due to unscheduled ATE downtimes.
半导体测试 准备维修计划 自动测试设备 经济学测试
Tongdan Jin Shu Xia Xiu-Lan Cheng
Texas A&M International University,USA Laredo,TX 78041 Broadband Application Engineering, Teradyne Inc.,USA Boston, MA 02118 School of Microelectronics, Shanghai Jiaotong University,China Shanghai, 20000
国内会议
苏州
英文
69-74
2008-05-21（万方平台首次上网日期，不代表论文的发表时间）