A note on word-length pattern

摘要：

A 4m2n design D can be constructed by the method of replacement from a 2n+3m design d.The relation between the word-length patterns of D and d is an interesting issue.In this paper,we study the relation between the word-length patterns of D and d.

关键词： word-length pattern orthogonal array asymmetrical experiment minimum aberration

作者: Sheng-Li Zhao Run-Chu Zhang

作者单位: LPMC and School of Mathematical Sciences.Nankai University Tianjin 300071;School of Mathematical Sci LPMC and School of Mathematical Sciences.Nankai University Tianjin 300071

会议类型: 国内会议

会议名称: 中国现场统计研究会第十二届学术年会

会议地点: 烟台

会议语种:英文

页码: 143-146

在线出版日期: 2005-07-28（万方平台首次上网日期，不代表论文的发表时间）