Efficient Statistical Leakage Power Analysis Method for Function Blocks Considering All Process Variations
With technology scaling into nanometer regime, rampant process variations impact visible influences on leakage power estimation of very large scale integrations (VLSIs). In order to deal with the case of large inter- and intra-die variations, we induce a novel theory prototype of the statistical leakage power analysis (SLPA) for function blocks. Because inter-die variations can be pinned down into a small range but the number of gates in function blocks is large(>1000), we continue to simplify the prototype. At last, we induce the efficient methodology of SLPA. The method can save much running time for SLPA in the low power design since it is of the local-updating advantage. A large number of experimental data show that the method only takes feasible running time (0.32 s) to obtain accurate results (3 σ-error <0.5％ on maximum) as function block circuits simultaneous suffer from 7.5％(3 σ/mean) inter-die and 7.5％ intra-die length variations, which demonstrates that our method is suitable for statistical leakage power analysis of VLSIs under rampant process variations.
process variations statistical analysis leakage power very large scale integration (VLSI)
LUO Zuying
College of Information Science and Technology,Beijing Normal University,Beijing 100875,China
国内会议
北京
英文
67-72
2007-07-15（万方平台首次上网日期，不代表论文的发表时间）