会议专题

2006 8th International Conference on Solid-State and Integrated Circuit Technology(第八届国际固态和集成电路技术会议)

总文献量: 663篇会议类型: 国际会议会议地点: 上海主办单位: 中国电子学会;复旦大学会议日期: 2006-10-23

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Challenges for RF SOC in nanometer technology

Ge MOS Transistor Technology and Reliability

An Investigation on the Permanent Component of NBTI Degradation in a 90nm CMOS Technology

A Novel High-k Gate Dielectric HfLaO for Next Generation CMOS Technology

Highly Efficient and Linear Class E SiGe Power Amplifier Design

0.6 μm CMOS pH sensor IC with Si3N4 island structure

10-GHz-Band VCO With Low Phase-Noise Using 0.18μm CMOS Process

Manufacturing Yield Ramp-up Methodogy for Advanced Technology

CMOS Shallow Trench Isolation x-Stress Effect on Channel Width for 130nm Technology

Analysis of Fringing-Electric-Field-Related Capacitance Behavior of Narrow-Channel FD SOI NMOS Devices Using 3D Simulation

T-Shaped Body Silicon-on-Insulator (SOI) MOSFET

A New Solution to Implement Multi-Full-Scan-Chain Test with JTAG

A novel current reference with low temperature coefficient in a large temperature range

Silicon Nanotechnologies and Emerging Non-Silicon Nanoelectronics (Plenary Talk)

Choices for future interconnect materials and processing

Modeling of Scattering at High-k Dielectric SiO2 Interface of Strained SiGe MOSFETs

Modeling of Geometry-Induced RF Characteristics of Double-Gate MOSFETs

Nonisothermal Effects in SOI CMOS Analog Integrated Circuits Based on Electrothermal Simulation

Design of A New Automatic Amplitude Control circuit for VCO

Analysis of SOI RESURF Structure with Charge Sharing Concept