Adjacent Device Thermal Effects Modeling and Characterization in Dielectrically Isolated Bipolar Technology
Hot Carrier Induced Leakage Current Instability in Metal Induced Laterally Crystallized n-type Poly-Silicon Thin Film Transistors
Effect of Implanting Silicon in buried oxide on the radiation hardness of the Partially-Depleted CMOS/SOI
The importance and challenges of comprehending circuit and physical phenomena in RF system design and integration