Effects of Four-Wave Mixing on Soliton’s Robustness to Polarization-Mode Dispersion in Optical Fiber Systems
Measurement of optical thickness variation of a multiple-surface object by a wavelength tuning interferometer
Measuring system on 3-D pose of the remote revolving target based on intersection measurment and its precision analysis
High Quality InAs0.04Sb0.96/GaAs Single Crystals with a Cutoff Wavelength of 12μm Grown by Melt Epitaxy