The XPS and GDS Study of SrBi2Ta2O9/ZrO2/Si (MFIS) Structure According to Heat Treatment Effects of ZrO2 Buffer Layer
Cell Sensing Margin of Lead-Free (Bi,La)4Ti3O12Thin Film Deposited on MTP Cell Structure in High Density FeRAM Device
Effect of Melt Depth and Nozzle Type on the Mixing Behavior in Bottom-Blown Steelmaking Ladle-A Water Model Approach
Development of Manufacturing Process Using Cold Incremental Forming Technique for Micro-Alloyed Non-Heat-Treated Material
Relationship between Microstructure and Tensile Strength in the Directionally Solidified (23-27) at. ﹪ Al-Ni Alloys
Effects of La2O3 on the Piezoelectric Properties of Lead-Free (Bi0.5Na0.5)0.94Ba0.06TiO3 Piezoelectric Ceramics
Characterization of Electrical Properties of Si Nanocrystals Embedded in an Insulating Layer by Scanning Probe Microscopy