The effect of SP process on the residual stress field of SiCw/Al composite by X-ray diffraction method

摘要：

The SiCw/Al composite specimens were treated by warm peening,stress peening and compound peening,respectively.Residual stress distributions of those specimens were investigated via X-ray diffraction method.Results revealed that comparing with conventional peening; warm peening can increase the maximum residual stress,the depth of compressive residual stress layer and improve stability of residual stress field.Meanwhile,stress peening can increase all characteristic parameters of residual stress field efficiently.Compound peening combines the positive effects of warm peening and stress peening,and has the most strengthening effects.

关键词： warm peening stress peening residual stress x-ray diffraction

作者: Junjie Huang Ke Zhan Chuanhai Jiang

作者单位: School of Material science and engineering, Shanghai Jiao Tong University, 800 Dongchuan Road, Shanghai 200240, People”s Republic of China P.R.China

会议类型: 国内会议

会议名称: 第十一届全国X射线衍射学术大会暨国际衍射数据中心(ICDD)研讨会

会议地点: 长春

会议语种:英文

页码: 107-110

在线出版日期: 2012-07-27（万方平台首次上网日期，不代表论文的发表时间）