Fracture behaviors of thin superconducting films with field-dependent critical current density

摘要：

　　The fracture behaviors under electromagnetic force with field-dependent critical current density in thin superconducting film are investigated. Applying finite element method, the stress intensity factors of one central crack versus applied field and crack length are obtained for the exponential model, which was compared with the Bean model and Kim model. This work can offer good estimations and provide a basis for interpretation of cracking and mechanical failure of HTS thin films in numerous real situations.

关键词： Fracture behaviors Superconducting film Stress intensity factor Exponential model

作者: An He Cun Xue Huadong Yong Youhe Zhou

作者单位: Department of Mechanics and Engineering Sciences,School of Civil Engineering and Mechanics,Lanzhou U Key Laboratory of Mechanics on Disaster and Environment in Western China attached to the Ministry of

会议类型: 国际会议

会议名称: 第13届国际断裂大会(ICF2013)

会议地点: 北京

会议语种:英文

页码: 1-8

在线出版日期: 2013-06-16（万方平台首次上网日期，不代表论文的发表时间）