Self-patterning through thin film buckling
Thin films may spontaneously form buckles if the residual stresses are compressive and large and if adhesion is weak. Buckling driven delamination leads to periodic patterns, such as the telephone cord morphology which has been studied for decades. Until recently the role of adhesion in the formation of buckling patterns was rather poorly understood. The difficulties are: 1. buckling is a non-linear phenomenon 2. Adhesion is a complex process involving mode mixity at the crack tip. Here coupling buckling and mixed-mode adhesion in a FEM model, we investigate the influence of film thickness, adhesion and residual stresses on the final buckle morphology. In particular, we show that it is possible to control the delamination front to create branching morphologies. Such morphologies remain periodic and can cover large areas. Experimentally, we show how the relevant conditions can be achieved for multilayer stacks of thin films deposited by magnetron sputtering. In particular we demonstrate self-organized hexagonal networks of buckles at the 10 micron scale. We anticipate that these patterns can be scaled from the micron-scale to the nano-scale.
Buckling Adhesion Mode mixity Patterning,
Jean-Yvon Faou Guillaume Parry Sergey Grachev Etienne Barthel
Surface du Verre et Interfaces,UMR 125 CNRS/Saint-Gobain,39 Quai Lucien Lefranc,F-93303 Aubervillier SIMAP,Institut National Polytechnique de Grenoble Domaine Universitaire1130 Rue de la Piscine,38 402
国际会议
北京
英文
1-4
2013-06-16（万方平台首次上网日期，不代表论文的发表时间）