会议专题

Experiment Research of Impact-Based Sensor to Monitor Corn Ear Yield

Accurate yield information is important for drawing yield map. In order to analyze the performance of impact-based sensor applied to monitoring the yield of corn ear, we did experiment on the test platform. In the experiment, the elevator speed ranged from 300rpm to 550 rpm. Groups were divided according to the rotational speeds, and in every group the elevator speed was constant. The yield monitor recorded real-time yield of the corns. The data showed the significant relation between yield and the elevator speed, and R~2 was 0.852936; max error was 16.04%. The variance analysis was done about the data of yield at three rotational speeds: low speed (300rpm), medium speed (450rpm), and high speed (550rpm). When the elevator speed was 300rpm, the yield was the most stable and its coefficient of variation (CV for short) was the lowest one: 3.66%. When the speed was 550rpm, the yield had min error and even its max error was just 12.29%. In the experiment, with different impact frequencies, the CV of the yield was 5.86%. When the frequency was higher than 2.5, the yield was more stable. The impact-based sensor can meet the requirement of yield monitoring for corn ear.

yield monitor impact-based sensor corn ear experimental analysis

Qi Jiangtao Zhang Shuhui Sun Yujing Niu Xutang Wang Wei Wang Lixia

Key Laboratory for Bionic Engineering, Ministry of Education, Jilin University Changchun 130022, China

国际会议

The 2010 International Conference on Computer Application and System Modeling(2010计算机应用与系统建模国际会议 ICCASM 2010)

太原

英文

513-516

2010-10-22(万方平台首次上网日期,不代表论文的发表时间)