Research on Reliability Estimation and Performance Prediction Based on Step-Up-Stress Accelerated Degradation Testing

摘要：

In order to evaluate the reliability guidelines for electronic equipment with high reliability and long life quickly,this paper presents the method of step up-stress accelerated degradation testing.First expatiate step-up-stress accelerated degradation testing and the basic assumptions in detailed,then gives the data conversion method from step up stress degradation data to constant stress degradation data;At the basis,propose step up stress accelerated degradation reliability assessment arithmetic based on random degradation path;A numerical example was given to illustrate the method in the end The testing method overcomes the shortages of constant degradation testing,which has higher testing efficiency.

关键词： Step-up-stress accelerated degradation testing (SUSADT) Random degradation path Data conversion Reliability assessment.

作者: Zhanqiang Jia Jinyan Cai Yuying Liang Chunhui Han

作者单位: Department of Optics and Electrics Engineering,Ordnance Engineering College Heping West road 97,050003 Shijiazhuang,China

会议类型: 国际会议

会议名称: 2009 9th International Conference on Electronic Measurement & Instruments(第九届电子测量与仪器国际会议 ICEMI2009)

会议地点: 北京

会议语种:英文

页码: 302-306

在线出版日期: 2009-08-16（万方平台首次上网日期，不代表论文的发表时间）